Journal Articles
Rundle, RP, Davies, BI,
Dwyer, VM, Tilma, T, Everitt, MJ (2020)
Visualization of correlations in hybrid discrete—continuous variable quantum systems,
Journal of Physics Communications, 4(2), pp.025002-025002, DOI:
10.1088/2399-6528/ab6fb6.
Bowen, JJ, Everitt, MJ, Phillips, IW,
Dwyer, VM (2019)
Generalized quantum cumulant dynamics,
The Journal of Chemical Physics, 151(24), pp.244107-244107, ISSN: 0021-9606. DOI:
10.1063/1.5130754.
Mills, PW, Rundle, R, Samson, J, Devitt, SJ, Tilma, T,
Dwyer, V, Everitt, M (2019)
Quantum invariants and the graph isomorphism problem,
Physical Review A, 100(5), 052317, ISSN: 2469-9926. DOI:
10.1103/physreva.100.052317.
Davies, B, Rundle, R,
Dwyer, V, Samson, J, Tilma, T, Everitt, M (2019)
Visualizing spin degrees of freedom in atoms and molecules,
Physical Review A, 100(4), pp.1-9, ISSN: 2469-9926. DOI:
10.1103/physreva.100.042102.
Rundle, RP, Tilma, T, Samson, J,
Dwyer, V, Bishop, RF, Everitt, M (2019)
General approach to quantum mechanics as a statistical theory,
Physical Review A, 99(1), 012115, ISSN: 2469-9926. DOI:
10.1103/physreva.99.012115.
Iakovlev, D, Hu, S,
Dwyer, V (2018)
Frame registration for motion compensation in imaging photoplethysmography,
Sensors (Switzerland), 18(12), ISSN: 1424-8220. DOI:
10.3390/s18124340.
Bjergstrom, K, Huish, WG, Henshaw, M,
Dwyer, V, Everitt, M (2018)
Transformational effects of applying systems engineering in laboratory scientific research,
IEEE Systems Journal, 13(2), pp.1924-1935, ISSN: 1932-8184. DOI:
10.1109/JSYST.2018.2865856.
Hassan, H, Jaidka, S,
Dwyer, V, Hu, S (2018)
Assessing blood vessel perfusion and vital signs through retinal imaging photoplethysmography,
Biomedical Optics Express, 9(5), pp.2351-2364, ISSN: 2156-7085. DOI:
10.1364/BOE.9.002351.
Iakovlev, D, Hu, S, Hassan, H,
Dwyer, V, Ashayer-Soltani, R, Hunt, C, Shen, J (2018)
Smart garment fabrics to enable non-contact opto-physiological monitoring,
Biosensors, ISSN: 2079-6374. DOI:
10.3390/bios8020033.
Dwyer, V, Duffus, SNA, Everitt, M (2017)
Open quantum systems, effective Hamiltonians, and device characterization,
Physical review B: Condensed Matter and Materials Physics, 96(13), ISSN: 2469-9950. DOI:
10.1103/PhysRevB.96.134520.
Yang, F, Hu, S, Li, B,
Dwyer, V, Hassan, H, Wei, D, Shi, P (2017)
A study of the dynamic relation between physiological changes and spontaneous expressions,
Scientific Reports, 7, ISSN: 2045-2322. DOI:
10.1038/s41598-017-07122-x.
Duffus, SNA, Bjergstrom, K,
Dwyer, V, Samson, J, Spiller, TP, Zagoskin, A, Munro, WJ, Nemoto, K, Everitt, M (2016)
Some implications of superconducting quantum interference to the application of master equations in engineering quantum technologies,
Physical Review B - Condensed Matter and Materials Physics, 94, ISSN: 0163-1829. DOI:
10.1103/PhysRevB.94.064518.
Chouliaras, V, Stevens, D,
Dwyer, V (2016)
VThreads: A novel VLIW chip multiprocessor with hardware-assisted PThreads,
Microprocessors and Microsystems, ISSN: 0141-9331. DOI:
10.1016/j.micpro.2016.07.010.
Lim, MK, Chouliaras, VA, Gan, CL, Dwyer, VM (Accepted for publication) Bidrectional Electromigration Failure, Microelectronics Reliability, On-line first, pp.1-3, DOI: 10.1016/j.microrel.2013.07.017.
Dwyer, VM (2012)
Diffusivity variation in Electromigration failure,
Microelectronics Reliability, 52(9-10), pp.1960-1965, ISSN: 0026-2714. DOI:
10.1016/j.microrel.2012.06.057.
Chen, G,
Dwyer, V, Krikidis, I, Thompson, JS, McLaughlin, S, Chambers, J (2012)
Comment on "relay selection for secure cooperative networks with Jamming",
IEEE Transactions on Wireless Communications, 11(6), p.2351, ISSN: 1536-1276. DOI:
10.1109/TWC.2012.12.112208.
Dwyer, VM (2012)
Reliability of various 2-out-of-4:G redundant systems with minimal repair,
IEEE Transactions on Reliability, 61(1), pp.170-179, ISSN: 0018-9529. DOI:
10.1109/TR.2012.2183907.
Dwyer, VM, Goodall, RM, Dixon, R (2012)
Reliability of 2-out-of-N:G systems with NHPP failure flows and fixed repair times,
International Journal of Reliability, Quality and Safety Engineering, 19(1), ISSN: 0218-5393. DOI:
10.1142/S0218539312500039.
Dwyer, VM (2012) Diffusivity variation in Electromigration failure,
Microelectronics Reliability, ISSN: 0026-2714.
Dwyer, VM (2011)
Analysis of Critical-Length Data from Electromigration Failure Studies,
Microelectronics Reliability, 51, pp.1568-1572, ISSN: 0026-2714.
Dwyer, VM (2010)
An investigation of electromigration induced void nucleation time statistics in short copper interconnects,
Journal of Applied Physics 107 (2010) 103718, 107(10), pp.1-12.
Dwyer, VM (2010)
Analysis of multistate models for electromigration failure,
Journal of Applied Physics, 107(3), pp.033709 (1-12).
Dwyer, VM (2008)
Modeling the Electromigration Failure Time Distribution in Short Copper Interconnects,
Journal of Applied Physics, 104(5), article 053708, ISSN: 0021-8979.
Chouliaras, V,
Dwyer, VM, Agha, S, Nunez Yanez, JL, Reisis, D, Nakos, K, Manolopoulos, K (2007) Customization of an Embedded RISCU CPU with SIMD Extensions for Video Encoding : A Case Study,
Integration : The VLSI Journal, pp.1-18, ISSN: 0167-9260.
Chouliaras, V, Agha, S, Jacobs, TR,
Dwyer, VM (2006) Quantifying the Benefit of a Thread and Data Parallelism for Fast Motion Estimation in MPEG-2,
IEE Electronics Letters, 42(13), pp.747-748.
Agha, S,
Dwyer, VM, Chouliaras, V (2005)
Motion Estimation with Low Resolution Distortion Metric,
Electronics Letters - ISSN 00135194, 41(12), pp.693-694, DOI:
10.1049/el:20050481.
Dwyer, VM (2004)
The Influence of Microstructure on the Probability of Early Failure In Aluminium-Based Interconnects,
Journal of Applied Physics, 96(5), pp.2914-2922, ISSN: 0021-8979. DOI:
10.1063/1.1771825.
Dwyer, VM (2004)
An Analysis of the Weakest-Link Model for Early Electromigration Failure,
Journal of Physics D: Applied Physics, 37(14), pp.2035-2046, ISSN: 1361-6463. DOI:
10.1088/0022-3727/37/14/020.
Dwyer, VM (2004)
An Analytical Model of the Microstructure in Near-Bamboo Interconnects,
Journal of Physics D: Applied Physics, 37(3), pp.422-431, ISSN: 0022-3727. DOI:
10.1088/0022-3727/37/3/020.
Dwyer, VM and Wan Ismail, WS (2001)
Electromigration Voiding in Nanoindented Single Crystal Al Lines,
Journal of Applied Physics, 89(5), pp.3064-3066, ISSN: 0021-8979. DOI:
10.1063/1.1342436.
Kearney, MJ, Horrell, AI,
Dwyer, VM (2000) The Transport-Time to State-Lifetime Ratio in Semiconductor Quantum-Well Alloys: A Multiple Scattering Analysis,
Semiconductor Science and Technology, 15(1), pp.24-31, ISSN: 0268-1242.
Kearney, MJ,
Dwyer, VM, Bressloff, PC (1997) On the Convergence of a Class of Random Geometric Series with Application to Random Walks and Percolation Theory,
J Phys A: Math Gen, 30, pp.L409-L414, ISSN: 0305-4470.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1997) Burgers' Equation on a Branching Structure,
Physics Letters A, 229, pp.37-43.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1997)
Classical Localization and Percolation in Random Environments on Trees,
Physical Review E, 55, pp.6765-6775, ISSN: 1063-651X.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1996) Localization-Delocalization Transition for Drift-Diffusion in a Random Environment,
Physical Review Letters, 77(25), pp.5075-5078, ISSN: 0031-9007.
Dwyer, VM, Kearney, MJ, Bressloff, PC (1996) An Integral Equation Approach to Electromigration under Arbitrary Time-Dependent Stress,
Journal of Applied Physics, 80(7), pp.3792-3797, ISSN: 0021-8979.
Dwyer, VM (1996) Electromigration Behaviour under a Unidirectional Time-Dependent Stress,
IEEE Transactions on Electron Devices, 43(6), pp.877-882, ISSN: 0018-9383.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1996) A 'Sum-Over-Paths' Approach to Diffusion on Trees,
Journal of Physics A: Maths Gen, 29, pp.1881-1896, ISSN: 0305-4470.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1996) Classical Localization for the Drift-Diffusion Equation on a Cayley Tree,
Journal of Physics A: Math Gen, 29, pp.6161-6168, ISSN: 0305-4470.
Bressloff, PC,
Dwyer, VM, Kearney, MJ (1996)
The Localization-Delocalization Transition for Drift-Diffusion in a Random Environment,
Physical Review Letters, 77, pp.5075-5078.
Dwyer, VM, Kearney, MJ, Bressloff, PC (1996) An Integral Equation Approach to Electromigration under Arbitrary Time-Dependent Stress,
Journal of Applied Physics, 80, pp.3792-3797.
Dwyer, VM, Wang, FS, Donaldson, P (1994) Electromigration Failure in a Finite Conductor with a Single Blocking Boundary,
Journal of Applied Physics, 76(11), pp.7305-3310, ISSN: 0021-8979.
Dwyer, VM (1994) Incorporation of Elastic Scattering into Composition-Depth Profile Reconstruction from Angle-Resolved Auger/XPS Data,
Surface and Interface Analysis, 21, pp.637-642.
Dwyer, VM (1994) Extraction of Inelastic Mean Free Path Data from Elastic Electron Backscattering Data,
Journal of Vacuum Science and Technology, A12(5), pp.2680-2684, ISSN: 0734-2101.
Dwyer, VM (1994) A Practical Depth Distribution Function for ARAES/APS,
Surface Science, 310, pp.L621-L624, ISSN: 0039-6028.
DWYER, VM (1994)
ANGULAR AND ENERGY-DISTRIBUTION OF AUGER AND PHOTOELECTRONS - COMMENTS,
SURFACE SCIENCE, 304(3), pp.383-384, ISSN: 0039-6028. DOI:
10.1016/0039-6028(94)91349-8.
Tunnicliffe, MJ, Dong, L,
Dwyer, VM (1994) Monitoring the Integrity of MOS Gate Oxides,
Journal of Electroceramics, 52, pp.333-342.
Dwyer, VM (1993) Reconstruction of the Depth Profile From Angle Resolved AES/XPS,
Surface and Interface Analysis, 20(8), pp.687-695, ISSN: 0142-2421.
Dwyer, VM (1993) A Confirmation of the Double-Exponential Approximation of the Depth Distribution Function for AES/XPS Using Reciprocal Two-Stream Methods,
Surface Science, 291, pp.261-270, ISSN: 0039-6028.
DWYER, VM (1993)
QUANTITATIVE-ANALYSIS IN LOW-ENERGY-ELECTRON TRANSMISSION AND REFLECTION SPECTROSCOPY,
PHYSICAL REVIEW A, 47(4), pp.3044-3049, ISSN: 1050-2947. DOI:
10.1103/PhysRevA.47.3044.
Dwyer, VM and Richards, JM (1993) Exact Analytical Solutions and Close Approximations to the Depth Distribution Function in AES & XPS,
Surface and Interface Analysis, 20, pp.271-275.
Dwyer, VM (1993)
Quantitative Analysis in Low-Energy -Electron Transmission and Reflection Spectroscopy,
Physical Review A, 47(4), pp.3044-3049, ISSN: 1050-2947.
Dwyer, VM (1993) Angular Distribution of Electrons Elastically Backscattered from Surfaces,
Surface and Interface, pp.513-518, ISSN: 0142-2421.
Tunnicliffe, MJ,
Dwyer, VM, Campbell, DS (1993) Latent Damage and Parametric Drift in Electrostatically Damaged MOS Transistors,
Journal of Electrostatics, 31, pp.91-110, ISSN: 0304-3886.
Franklin, AJ and
Dwyer, VM (1993) Electrical Characterisation of ESD Degradation in GaAs Devices,
Journal of Electrostatics, 31, pp.35-50, ISSN: 0304-3886.
Dwyer, VM (1993) Reconstruction of the depth profile from angle-resolved AES/XPS,
Surface and Interface Analysis, 20, pp.687-685.
Dwyer, VM and Richards, JM (1992) The Depth Distribution Function in auger/XPS Analysis,
Surface and Interface Analysis, 18(7), pp.555-560, ISSN: 0142-2421.
SMITH, PR and
DWYER, VM (1991)
NONLINEAR INTERFERENCE DEVICES FOR ALL-OPTICAL SELF-ROUTEING,
JOURNAL OF MODERN OPTICS, 38(12), pp.2491-2504, ISSN: 0950-0340. DOI:
10.1080/09500349114552621.
FRANKLIN, AJ and
DWYER, VM (1991)
ESD DEGRADATION IN GAAS MES STRUCTURES,
SOLID-STATE ELECTRONICS, 34(10), pp.1091-1102, ISSN: 0038-1101. DOI:
10.1016/0038-1101(91)90105-8.
DWYER, VM, FRANKLIN, AJ, CAMPBELL, DS (1990)
ELECTROSTATIC DISCHARGE THERMAL FAILURE IN SEMICONDUCTOR-DEVICES,
IEEE TRANSACTIONS ON ELECTRON DEVICES, 37(11), pp.2381-2387, ISSN: 0018-9383. DOI:
10.1109/16.62296.
FRANKLIN, AJ,
DWYER, VM, CAMPBELL, DS (1990)
THERMAL BREAKDOWN IN GAAS MES DIODES,
SOLID-STATE ELECTRONICS, 33(8), pp.1055-1064, ISSN: 0038-1101. DOI:
10.1016/0038-1101(90)90220-9.
DWYER, VM, FRANKLIN, AJ, CAMPBELL, DS (1990)
THERMAL FAILURE IN SEMICONDUCTOR-DEVICES,
SOLID-STATE ELECTRONICS, 33(5), pp.553-560, ISSN: 0038-1101. DOI:
10.1016/0038-1101(90)90239-B.
Carter, JN,
Dwyer, VM, Holland, BW (1988)
Structure of the α phase of Ge(1 1 1) √3 × √3-Pb,
Solid State Communications, 67(6), pp.643-645, ISSN: 0038-1098. DOI:
10.1016/0038-1098(88)90183-4.
Dwyer, VM and Matthew, JAD (1988)
Background intensity determination in AES/XPS,
Surface Science, 193(3), pp.549-568, ISSN: 0039-6028. DOI:
10.1016/0039-6028(88)90453-0.
DWYER, VM and MATTHEW, JAD (1988)
EXTRINSIC LOSS REMOVAL IN AES/XPS,
VACUUM, 38(4-5), pp.429-429, ISSN: 0042-207X.
CARTER, JN,
DWYER, VM, HOLLAND, BW (1988)
EMPIRICAL TIGHT-BINDING CLUSTER METHOD FOR SEMICONDUCTOR SURFACE-STRUCTURES,
VACUUM, 38(4-5), pp.430-430, ISSN: 0042-207X.
Carter, JN,
Dwyer, VM, Holland, BW (1987)
Empirical tight binding cluster method for semiconductor surface structures,
Surface Science Letters, 188(3), ISSN: 0167-2584. DOI:
10.1016/0167-2584(87)90580-9.
DWYER, VM and WEAIRE, DL (1986)
A CRITICAL-EXAMINATION OF A NEW VERSION OF THE EQUATION-OF-MOTION METHOD,
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 53(1), pp.L35-L41, ISSN: 0141-8637. DOI:
10.1080/13642818608238965.
Weaire, D, Kermode, JP,
Dwyer, VM (1985)
The role of diffraction in dispersive optical bistability,
Optics Communications, 55(3), pp.223-228, ISSN: 0030-4018. DOI:
10.1016/0030-4018(85)90052-5.
Dwyer, VM and Matthew, JAD (1985)
A comparison of electron transport in AES/PES with neutron transport theory,
Surface Science, 152-153(PART 2), pp.884-894, ISSN: 0039-6028. DOI:
10.1016/0039-6028(85)90501-1.
DWYER, J, FITCH, FR, DOOLAN, PT,
DWYER, VM, HALLS, NA, TALLENTIRE, A (1985)
TOWARDS MICROBIOLOGICAL QUALITY ASSURANCE IN RADIATION STERILIZATION PROCESSING - THE LIMITING CASE MODEL APPLIED TO A MICROBIAL-POPULATION HAVING A DISTRIBUTION OF RADIATION RESPONSES,
JOURNAL OF APPLIED BACTERIOLOGY, 59(2), pp.189-194, ISSN: 0021-8847. DOI:
10.1111/j.1365-2672.1985.tb03320.x.
FITCH, FR, DOOLAN, PT, DWYER, J,
DWYER, VM, HALLS, NA, TALLENTIRE, A (1985)
TOWARDS MICROBIOLOGICAL QUALITY ASSURANCE IN RADIATION STERILIZATION PROCESSING - SIMULATION OF THE RADIATION INACTIVATION PROCESS,
JOURNAL OF APPLIED BACTERIOLOGY, 58(3), pp.307-313, ISSN: 0021-8847. DOI:
10.1111/j.1365-2672.1985.tb01465.x.
DOOLAN, PT, DWYER, J,
DWYER, VM, FITCH, FR, HALLS, NA, TALLENTIRE, A (1985)
TOWARDS MICROBIOLOGICAL QUALITY ASSURANCE IN RADIATION STERILIZATION PROCESSING - A LIMITING CASE MODEL,
JOURNAL OF APPLIED BACTERIOLOGY, 58(3), pp.303-306, ISSN: 0021-8847. DOI:
10.1111/j.1365-2672.1985.tb01464.x.
Dwyer, VM and Matthew, JAD (1984)
The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solids,
Surface Science, 143(1), pp.57-83, ISSN: 0039-6028. DOI:
10.1016/0039-6028(84)90410-2.
Matthew, JAD, Jones, RE,
Dwyer, VM (1983)
The effect of short-range order on the vibrational entropy of one-dimensional chains,
Journal of Physics F: Metal Physics, 13(3), pp.581-585, ISSN: 0305-4608. DOI:
10.1088/0305-4608/13/3/008.
Dwyer, VM and Matthew, JAD (1983)
The effect of elastic scattering on the effective inelastic mean free path,
Vacuum, 33(10-12), pp.767-769, ISSN: 0042-207X. DOI:
10.1016/0042-207X(83)90606-1.
Conferences
Everitt, M, Henshaw, M,
Dwyer, V (2016)
Quantum systems engineering: a structured approach to accelerating the development of a quantum technology industry. In
Invited contribution to 18th International Conference on Transparent Optical Networks ICTON 2016 (topic: quantum photonics), Trento, Italy,ISBN: 9781509014675. DOI:
10.1109/ICTON.2016.7550613.
Iakovlev, D,
Dwyer, V, Hu, S, Silberschmidt, V (2016)
Noncontact blood perfusion mapping in clinical applications. In
Proceedings of SPIE - The International Society for Optical Engineering,, ISBN: 9781510601321. DOI:
10.1117/12.2225216.
Hassan, H, Hu, S,
Dwyer, V (2015)
A dynamic opto-physiological model to effectively interpret retinal microvascular circulation. In
, San Francisco, CA. DOI:
10.1117/12.2076899.
Dwyer, VM (2009) Reliability of 2-out-of-N Redundant Safety-Critical Systems with a Time-varying Single-component Failure Rate. In
Proceedings of 18th ARZTS Conference, Loughborough, Leics, pp.126-137.
Goodall, R, Dixon, R,
Dwyer, VM (2007)
Operational reliability calculations for critical systems. In
, pp.771-776, ISBN: 9780080444857. DOI:
10.1016/B978-008044485-7/50130-5.
Goodall, RM, Dixon, R,
Dwyer, VM (2006)
Operational Reliability Calculations for Critical Systems. In Zhang Zhang, (ed)
Proceedings of 6th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes (SAFEPROCESS) 2006, Beijing, China, pp.771-776.
Dwyer, VM, Agha, S, Chouliaras, V (2005) Reduced-Bit Full Search Block-Matching Algorithms and Their Hardware Realizations. In
ACIVS 2005, Antwerp Belgium, pp.372-380.
Chouliaras, V,
Dwyer, VM, Agha, S (2005) On the Performance Improvement of Sub-Sampling MPEG-2 Motion Estimation Algorithms with Vector/SIMD Architectures. In
ACIVS 2005, Antwerp Belgium, pp.595-602.
Dwyer, VM, Agha, S, Chouliaras, V (2005) Low Power Full Search Block Matching Using Reduced Bit SAD Values for Early Termination. In
Mirage 2005 International Conference on Computer Vision/Computer Graphics Collaboration Techniques, INRIA Rocquencourt Paris France, pp.191-196.
Dong, L and
Dwyer, VM (1994) A Comparison of Static and Dynamic Techniques for the Detection of Gate Oxide Shorts in Digital MOS Circuits. In Brydon, GME (ed)
Proceeedings of the 5th ESREF Conference, Glasgow, pp.565-569.
Dong, L, Tunnicliffe, MJ,
Dwyer, VM (1994) Pre-Breakdown Charge Trapping in High Field Stressed Oxides. In Brydon, GME (ed)
Proceedings of the 5th ESREF Conference, Glasgow, pp.117-120.
Dwyer, VM (1994) Modelling Electromigration Problems for High Frequency AC or Pulsed Stress. In Hamza, MHE (ed)
Proceedings of the IASTED International Conference on Applied Modelling and Simulation, Lugano, Switzerland, pp.124-126, ISBN: 0 889 86-196-X.
Donaldson, P, Wang, FS,
Dwyer, VM (1993) Saturation of the Forward Bias Leakage Current of an AlGaAs/GaAs HJBT Under Reverse Bias Stress of the E-B Junction. In
4th European Symposium on Reliability of Electron Devices, Bordeaux France, pp.493-498.
DWYER, VM (1993)
RECONSTRUCTION OF THE DEPTH PROFILE FROM ANGLE-RESOLVED AES XPS. In
CONF ON QUANTITATIVE SURFACE ANALYSIS ( QSA-7 ), SURFACE AND INTERFACE ANALYSIS, UNIV SURREY, GUILDFORD, ENGLAND, pp.687-695, DOI:
10.1002/sia.740200813.
Tunnicliffe, M,
Dwyer, VM, Campbell, DS (1992) Parametric Drift in Electrostatically Damaged MOS Transistors. In
Proceedings of the Electrical Overstress/Electro-Static Discharge Symposium, USA, pp.112-120, ISBN: 1 878303 34 1.
Dwyer, VM, Carter, JN, Holland, BW (1988) Charge self-consistent empirical tight binding cluster method for semiconductor surfaces and interface. In
ICSOS, Springer Series in Surface Science, Amsterdam, pp.320-327.
